EERAM memory delivers cost savings

Microchip claims up to 25 percent cost savings with its new SPI EERAM memory compared to serial NVRAM devices.

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Littelfuse adds high-speed fuses with bladed mounting options

Littelfuse’s POWR-SPEED PSR series of semiconductor fuses now includes new bolted and DIN blade models in various sizes and amperages.

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High-speed IR emitters increase brightness by 30%

Vishay’s SurfLight IR emitters deliver 30% higher brightness than previous generation devices over a wide operating temperature range of -40°C to 110°C.

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C&K claims smallest tactile switch for IoT devices

C&K’s NanoT series of tactile switches targets space-constrained applications, including wearable medical devices and smartwatches.

 

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EERAM memory delivers cost savings

Microchip claims up to 25 percent cost savings with its new SPI EERAM memory compared to serial NVRAM devices.

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Why test must follow design’s example by adopting a platform-based approach

Platform-based test workflow breaks down homegrown test environment silos and fosters software reuse, resulting in a faster time to market, increased productivity, and improved cost efficiency.

source http://www.electronicproducts.com/Test_and_Measurement/Test_and_Measurement_Software/Why_test_must_follow_design_s_example_by_adopting_a_platform_based_approach.aspx

Why test must follow design’s example by adopting a platform-based approach

Platform-based test workflow breaks down homegrown test environment silos and fosters software reuse, resulting in a faster time to market, increased productivity, and improved cost efficiency.

from Electronic Products Technology Center Articles https://ift.tt/2qbjx7M